JEOL Scanning Electron Microscope
- Make: JEOL
- Model: JSM-IT200 InTouchScope™
- Vintage: 2018
- Option: IXRF EDS detector with it
- Versatile, high throughput SEM from JEOL combined with the intuitive operation of a table-top SEM.
- The IT200 is a simple-to-use, research-grade SEM with a compact ergonomic design.
Features:
- The InTouchScope features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design.
- It is very easy to install since neither cooling water nor gas is necessary.
Practical features for users of all levels:
- High resolution imaging in HV/LV/SE/BSE
- Zeromag-mode for intuitive transition from light-optic to SEM image
- Chemical analysis with integrated EDS and live analysis
- Multi-touch screen control and wireless operation
- Automatic SEM condition setup based on sample type
- Simultaneous multiple live image and movie capture
- Fast sample navigation at 5x – 300,000x magnifications
- Smile View Premium with image sharpening, montaging, position alignment and overlay
- Compact floor space: ca. 0,5m²
Specifications Resolution:
- High Vacuum mode: 3nm (30kV)*, 4nm (20kV), 8nm (3kV), 15nm (1kV)
- Low Vacuum mode: 4nm (30kV)*, 5nm (20kV) BSE
- Accelerating voltage: 0,5 -30 kV
- Magnification: x5 to x300,000 (Polaroid reference)
LV detector:
- Multi-segment BSED (std.)
- LV-SED (option)
- LV pressure: 10 ∼ 100 Pa
Maximum specimen size:
- Observation：125mm diameter
- Loadable：152mm
- Height：50mm
LGS type stage:
- Eucentric goniometer
- X=80mm (motorized), Y=40mm (motorized), Z=5mm-48mm
- R=360° (endless)
- Tilt -10/+90°
- (optional: 3- or 5-axis motor drive)
- Frame Store: Up to 5120×3840 pixels
EDS:
- Integrated JEOL EDS in IT200A and IT200LA models with live analysis, spectrum acquisition/display function, qualitative/quantitative analysis, line analysis (horizontal, multi-point), spectral mapping, and automatic drift compensation
- BSE: Standard in IT200LV or IT200LA models